Energy Efficient And Reliable Embedded Nanoscale Sram Design

Energy Efficient And Reliable Embedded Nanoscale Sram Design

$186.38
Sale price  $186.38 Regular price  $186.38
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Energy Efficient And Reliable Embedded Nanoscale Sram Design

Energy Efficient And Reliable Embedded Nanoscale Sram Design

$186.38
Sale price  $186.38 Regular price  $186.38
SKU: DADAX1032081597
ISBN: 9781032081595
Publisher: CRC Press
Availability: In Stock
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Description

This Reference Text Covers A Wide Spectrum For Designing Robust Embedded Memory And Peripheral Circuitry. It Will Serve As A Useful Text For Senior Undergraduate And Graduate Students And Professionals In Areas Including Electronics And Communications Engineering, Electrical Engineering, Mechanical Engineering, And Aerospace Engineering.Discusses Low-Power Design Methodologies For Static Random-Access Memory (Sram)Covers Radiation-Hardened Sram Design For Aerospace Applicationsfocuses On Various Reliability Issues That Are Faced By Submicron Technologiesexhibits More Stable Memory Topologiesnanoscale Technologies Unveiled Significant Challenges To The Design Of Energy- Efficient And Reliable Srams. This Reference Text Investigates The Impact Of Process Variation, Leakage, Aging, Soft Errors And Related Reliability Issues In Embedded Memory And Periphery Circuitry.The Text Adopts A Unique Way To Explain The Sram Bitcell, Array Design, And Analysis Of Its Design Parameters To Meet The Sub-Nano-Regime Challenges For Complementary Metal-Oxide Semiconductor Devices. It Comprehensively Covers Low- Power-Design Methodologies For Sram, Exhibits More Stable Memory Topologies, And Radiation-Hardened Sram Design For Aerospace Applications. Every Chapter Includes A Glossary, Highlights, A Question Bank, And Problems. The Text Will Serve As A Useful Text For Senior Undergraduate Students, Graduate Students, And Professionals In Areas Including Electronics And Communications Engineering, Electrical Engineering, Mechanical Engineering, And Aerospace Engineering. Discussing Comprehensive Studies Of Variability-Induced Failure Mechanism In Sense Amplifiers And Power, Delay, And Read Yield Trade-Offs, This Reference Text Will Serve As A Useful Text For Senior Undergraduate, Graduate Students, And Professionals In Areas Including Electronics And Communications Engineering, Electrical Engineering, Mechanical Engineering, And Aerospace Engineering. It Covers The Development Of Robust Srams, Well Suited For Low-Power Multi-Core Processors For Wireless Sensors Node, Battery-Operated Portable Devices, Personal Health Care Assistants, And Smart Internet Of Things Applications.

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Product Notice This book is sold in used condition unless explicitly stated as new. Condition is graded and described accurately. Some books may contain previous owner's markings, highlights, or inscriptions. This product may contain chemicals known to the State of California to cause cancer or reproductive harm. For more information visit www.P65Warnings.ca.gov

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